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Title: Ellipsometry - Principles and Techniques for Materials Characterization
Authors: Wahaia, Faustino
Keywords: Đặc tính Vật liệu; Phép đo Ellipsometry
Issue Date: 2017
Publisher: IntechOpen
Abstract: Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.
URI: http://dlib.hust.edu.vn/handle/HUST/22086
Link item primary: https://www.intechopen.com/books/5818
ISBN: 9789535136231
Appears in Collections:OER - Kỹ thuật vật liệu; Kỹ thuật nhiệt; Vật lý kỹ thuật; Kỹ thuật Dệt - may
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